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Comprehensive failure analysis of leakage faults in bipolar transistors
Domengès, B, Murray, H, Schwindenhammer, P, Imbert, GVolume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/2/011
Date:
February, 2004
File:
PDF, 207 KB
english, 2004