Comprehensive failure analysis of leakage faults in bipolar...

Comprehensive failure analysis of leakage faults in bipolar transistors

Domengès, B, Murray, H, Schwindenhammer, P, Imbert, G
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Volume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/2/011
Date:
February, 2004
File:
PDF, 207 KB
english, 2004
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