Charge trapping properties of ultra-thin TiO 2 films on strained-Si
Bera, M K, Maiti, C KVolume:
22
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/22/7/017
Date:
July, 2007
File:
PDF, 906 KB
english, 2007