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The effect of radiation damage on carrier mobility in neutron-transmutation-doped silicon
Maekawa, T, Inoue, S, Aiura, M, Usami, AVolume:
3
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/3/2/002
Date:
February, 1988
File:
PDF, 718 KB
english, 1988