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High-resolution imaging with an aberration-corrected transmission electron microscope
M. Lentzen, B. Jahnen, C.L. Jia, A. Thust, K. Tillmann, K. UrbanVolume:
92
Year:
2002
Language:
english
Pages:
10
DOI:
10.1016/s0304-3991(02)00139-0
File:
PDF, 747 KB
english, 2002