Volume 92; Issue 3-4

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Ultramicroscopy
Volume 92; Issue 3-4

Ultramicroscopy

Volume 92; Issue 3-4

1

Determination of crystal polarity from bend contours in transmission electron microscope images

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 763 KB

english, 2002

2

Conducting, semiconducting and insulating objects observed by low-energy electron holography

J Bardon, A Degiovanni, V Georges, R Morin

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 457 KB

english, 2002

3

Detection of hydrogen by electron Rutherford backscattering

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 162 KB

english, 2002

4

Accuracy of AFM measurements of the contour length of DNA fragments adsorbed on mica in air and in aqueous buffer

Albert Sanchez-Sevilla, Jean Thimonier, Monique Marilley, José Rocca-Serra, Jacques Barbet

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 218 KB

english, 2002

5

Preparation of thin ceramic monofilaments for characterization by TEM

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 278 KB

english, 2002

6

A fast beam switch for controlling the intensity in electron energy loss spectrometry

A.J Craven, J.A Wilson, W.A.P Nicholson

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 263 KB

english, 2002

7

Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging

T Yamazaki, M Kawasaki, K Watanabe, I Hashimoto, M Shiojiri

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 547 KB

english, 2002

8

Deconvolution processing of HAADF STEM images

K. Watanabe, Y. Kotaka, N. Nakanishi, T. Yamazaki, I. Hashimoto, M. Shiojiri

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 374 KB

english, 2002

9

A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology

Aiguo Wu, Zhuang Li, Lihua Yu, Hongda Wang, Erkang Wang

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 311 KB

english, 2002

10

Local lattice distortions in spherical carbon nanoparticles as studied by HRTEM image analysis

M Romeo, J.C Arnault, G Ehret, F Banhart, F.Le Normand

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 201 KB

english, 2002

11

Transfer-matrix simulations of field emission from a metallic (5,5) carbon nanotube

A. Mayer, N.M. Miskovsky, P.H. Cutler

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 180 KB

english, 2002

12

Combined microscope for scanning X-ray transmission and surface topography

M.T Browne, P Charalambous, R.E Burge, X.-C Yuan

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 385 KB

english, 2002

13

High-resolution imaging with an aberration-corrected transmission electron microscope

M. Lentzen, B. Jahnen, C.L. Jia, A. Thust, K. Tillmann, K. Urban

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 747 KB

english, 2002

14

Optical interference artifacts in contact atomic force microscopy images

A Méndez-Vilas, M.L González-Martı́n, M.J Nuevo

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 746 KB

english, 2002

15

Propagation of femtosecond light pulses through near-field optical aperture probes

A Pack, M Hietschold, R Wannemacher

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 374 KB

english, 2002

16

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samples

E.A Preble, H.A McLean, S.M Kiesel, P Miraglia, M Albrecht, R.F Davis

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 292 KB

english, 2002

17

Polarity determination of III–V compound semiconductors by large-angle convergent beam electron diffraction

Ch. Jäger, E. Spiecker, J.P. Morniroli, W. Jäger

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 406 KB

english, 2002

18

Separation of pure elemental and oxygen influenced signal in ELNES

M Stöger, P Schattschneider, L.Y Wei, B Jouffrey, C Eisenmenger-Sittner

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 142 KB

english, 2002

19

Coherence and incoherence of inelastically scattered electron waves

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 155 KB

english, 2002

20

Author Index

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 50 KB

english, 2002

21

Subject guide

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 38 KB

english, 2002

22

Subject Index

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 68 KB

english, 2002

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