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Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samples
E.A Preble, H.A McLean, S.M Kiesel, P Miraglia, M Albrecht, R.F DavisVolume:
92
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0304-3991(02)00142-0
File:
PDF, 292 KB
english, 2002