Development of an ellipse fitting method with which to...

Ultramicroscopy 2016 / 01 Vol. 160

Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns

Mitchell, D.R.G., Van den Berg, J.A.
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Volume:
160
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2015.10.009
Date:
January, 2016
File:
PDF, 1.00 MB
english, 2016
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