Volume 160

Ultramicroscopy

Volume 160

1

Effect of the laser pulse width on the field evaporation behavior of metals and oxides

Wang, H., Houard, J., Arnoldi, L., Hideur, A., Silaeva, E.P., Deconihout, B., Vella, A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.18 MB

english, 2016

2

Why Principal Component Analysis of STEM spectrum-images results in “abstract”, uninterpretable loadings?

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 13.27 MB

english, 2016

3

Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns

Mitchell, D.R.G., Van den Berg, J.A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.00 MB

english, 2016

4

Self-adapting denoising, alignment and reconstruction in electron tomography in materials science

Printemps, Tony, Mula, Guido, Sette, Daniele, Bleuet, Pierre, Delaye, Vincent, Bernier, Nicolas, Grenier, Adeline, Audoit, Guillaume, Gambacorti, Narciso, Hervé, Lionel

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 6.87 MB

english, 2016

5

Experimental evaluation of the ‘transport-of-intensity’ equation for magnetic phase reconstruction in Lorentz transmission electron microscopy

Kohn, Amit, Habibi, Avihay, Mayo, Martin

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.93 MB

english, 2016

6

Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging

Soltani Bozchalooi, I., Careaga Houck, A., AlGhamdi, J., Youcef-Toumi, K.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 8.90 MB

english, 2016

7

Intensity distribution analysis of cathodoluminescence using the energy loss distribution of electrons

Fukuta, Masahiro, Inami, Wataru, Ono, Atsushi, Kawata, Yoshimasa

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 724 KB

english, 2016

8

A simple approach to atom probe sample preparation by using shadow masks

Felfer, Peter, McCarroll, Ingrid, Macauley, Chandra, Cairney, Julie M.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.32 MB

english, 2016

9

Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yield

Tizei, Luiz H.G., Iizumi, Yoko, Okazaki, Toshiya, Nakanishi, Ryo, Kitaura, Ryo, Shinohara, Hisanori, Suenaga, Kazu

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 2.25 MB

english, 2016

10

Simulation of the enhancement factor from an individual 3D hemisphere-on-post field emitter by using finite elements method

Roveri, D.S., Sant’Anna, G.M., Bertan, H.H., Mologni, J.F., Alves, M.A.R., Braga, E.S.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.82 MB

english, 2016

11

Phase contrast STEM for thin samples: Integrated differential phase contrast

Lazić, Ivan, Bosch, Eric G.T., Lazar, Sorin

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.51 MB

english, 2016

12

Functional extension of high-speed AFM for wider biological applications

Uchihashi, Takayuki, Watanabe, Hiroki, Fukuda, Shingo, Shibata, Mikihiro, Ando, Toshio

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 5.06 MB

english, 2016

13

A phantom-based forward projection approach in support of model-based iterative reconstructions for HAADF-STEM tomography

Venkatakrishnan, S.V., Drummy, L.F., Jackson, M.A., Bouman, C.A., Simmons, J.P., De Graef, M.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.37 MB

english, 2016

14

A novel 3D absorption correction method for quantitative EDX-STEM tomography

Burdet, Pierre, Saghi, Z., Filippin, A.N., Borrás, A., Midgley, P.A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.55 MB

english, 2016

15

Differential phase-contrast dark-field electron holography for strain mapping

Denneulin, Thibaud, Houdellier, Florent, Hÿtch, Martin

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 6.40 MB

english, 2016

16

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction

Nolze, Gert, Winkelmann, Aimo, Boyle, Alan P.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1013 KB

english, 2016

17

Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopy

Fitzgerald, J.P.S., Word, R.C., Könenkamp, R.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 454 KB

english, 2016

18

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 79 KB

english, 2016

19

On the validity of the Čerenkov limit as a criterion for precise band gap measurements by VEELS

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 693 KB

english, 2016

20

Addressing preservation of elastic contrast in energy-filtered transmission electron microscopy

Brown, H.G., D'Alfonso, A.J., Forbes, B.D., Allen, L.J.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.13 MB

english, 2016

21

Towards an optimum design for thin film phase plates

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 3.61 MB

english, 2016

22

Light propagation and interaction observed with electrons

Word, Robert C., Fitzgerald, J.P.S., Könenkamp, R.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 6.22 MB

english, 2016

23

Compressed sensing electron tomography of needle-shaped biological specimens – Potential for improved reconstruction fidelity with reduced dose

Saghi, Zineb, Divitini, Giorgio, Winter, Benjamin, Leary, Rowan, Spiecker, Erdmann, Ducati, Caterina, Midgley, Paul A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 2.87 MB

english, 2016

24

Quantitative nanoscopy: Tackling sampling limitations in (S)TEM imaging of polymers and composites

Gnanasekaran, Karthikeyan, Snel, Roderick, de With, Gijsbertus, Friedrich, Heiner

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.26 MB

english, 2016

25

Sample tilt effects on atom column position determination in ABF–STEM imaging

Zhou, Dan, Müller-Caspary, Knut, Sigle, Wilfried, Krause, Florian F., Rosenauer, Andreas, van Aken, Peter A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 5.53 MB

english, 2016

26

Design and implementation of a micron-sized electron column fabricated by focused ion beam milling

Wicki, Flavio, Longchamp, Jean-Nicolas, Escher, Conrad, Fink, Hans-Werner

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 2.27 MB

english, 2016

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