Determination of Majority Carrier Capture Rates via Deep...

ECS Journal of Solid State Science and Technology 2016 Vol. 5; Iss. 4

Determination of Majority Carrier Capture Rates via Deep Level Transient Spectroscopy

Lauwaert, J., Khelifi, S., Vrielinck, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5
Year:
2016
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0071604jss
File:
PDF, 754 KB
english, 2016
Conversion to is in progress
Conversion to is failed