Volume 5; Issue 4

Main
ECS Journal of Solid State Science and Technology
Volume 5; Issue 4

ECS Journal of Solid State Science and Technology

Volume 5; Issue 4

1

Electrical Characterization of the Influence of the Annealing Energy Density on Carrier Lifetimes in Germanium

Filippone, Bruno, Donaldson, Conor, Shayesteh, Maryam, O'Connell, Dan, Huet, Karim, Toqué-Tresonne, Ines, Crupi, Felice, Duffy, Ray

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 814 KB

english, 2016

2

Determination of Majority Carrier Capture Rates via Deep Level Transient Spectroscopy

Lauwaert, J., Khelifi, S., Vrielinck, H.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 754 KB

english, 2016

3

Review—Characterization of Metal-Contamination Effects in Silicon

Polignano, M. L., Codegoni, D., Galbiati, A., Grasso, S., Mica, I., Moccia, G., Nardone, G., Russo, F.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.46 MB

english, 2016

4

Fermi-Level Effects on Extended Defect Evolution in Si + and P + Implanted In 0.53 Ga 0.47 As

Lind, A. G., Aldridge, H. L., Bomberger, C. C., Hatem, C., Zide, J. M. O., Jones, K. S.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.32 MB

english, 2016

5

Characterization of Shallow- and Deep-Level Defects in Undoped Ge 1− x Sn x Epitaxial Layers by Electrical Measurements

Takeuchi, Wakana, Asano, Takanori, Inuzuka, Yuki, Sakashita, Mitsuo, Nakatsuka, Osamu, Zaima, Shigeaki

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 449 KB

english, 2016

6

Review—Device Assessment of Electrically Active Defects in High-Mobility Materials

Claeys, C., Simoen, E., Eneman, G., Ni, K., Hikavyy, A., Loo, R., Gupta, S., Merckling, C., Alian, A., Caymax, M.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 2.98 MB

english, 2016

7

The Impact of Defects on GaN Device Behavior: Modeling Dislocations, Traps, and Pits

Moroz, Victor, Wong, Hiu Yung, Choi, Munkang, Braga, Nelson, Mickevicius, R. V., Zhang, Yuhao, Palacios, Thomas

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.33 MB

english, 2016

8

Defects and Dopants in Silicon Nanowires Produced by Metal-Assisted Chemical Etching

Fanciulli, M., Belli, M., Paleari, S., Lamperti, A., Sironi, M., Pizio, A.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 373 KB

english, 2016

9

Electrical Investigation of Porous Silicon/p-Si Heterojunction Prepared by Electrochemical Etching

Chavarria, M. A., Fonthal, F.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 516 KB

english, 2016

10

Non-Visual Defect Monitoring with Surface Voltage Mapping

Findlay, Andrew, Marinskiy, Dmitriy, Edelman, Piotr, Wilson, Marshall, Savtchouk, Alexandre, Lagowski, Jacek

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 2.66 MB

english, 2016

11

Nanoscale Chemical-Mechanical Characterization of Nanoelectronic Low- k Dielectric/Cu Interconnects

Lo, Michael K. F., Dazzi, Alexandre, Marcott, Curtis A., Dillon, Eoghan, Hu, Qichi, Kjoller, Kevin, Prater, Craig B., King, Sean W.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1009 KB

english, 2016

12

Review—Properties of Intrinsic Point Defects in Si and Ge Assessed by Density Functional Theory

Sueoka, Koji, Kamiyama, Eiji, Śpiewak, Piotr, Vanhellemont, Jan

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 3.54 MB

english, 2016

13

Defect Levels in Nuclear Detector Grade Cd 0.9 Zn 0.1 Te Crystals

Pak, Rahmi O., Mandal, Krishna C.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 498 KB

english, 2016

14

Deep Level Studies in High-Resistive Gallium Phosphide Single Crystals

Das, Sandip, Chaudhuri, Sandeep K., Mandal, Krishna C.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 529 KB

english, 2016

15

Comparative Study of Current Transients in HPHT and CVD Diamond Capacitor-Sensors

Gaubas, E., Ceponis, T., Meskauskaite, D., Simoen, E.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 965 KB

english, 2016

16

Saturation Photo-Voltage Methodology for Semiconductor/Insulator Interface Trap Spectroscopy

Madia, O., Afanas'ev, V. V., Cott, D., Arimura, H., Schulte-Braucks, C., Lin, H. C., Buca, D., Driesch, N. Von Den, Nyns, L., Ivanov, T., Cuypers, D., Stesmans, A.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 787 KB

english, 2016

17

Electrical Characterization of Silicon-on-Insulator Wafers Using Photo-Conductance Decay (PCD) Method

Arora, A., Drummond, P. J., Ruzyllo, J.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 525 KB

english, 2016

18

Sensitivity of Signal-to-Noise Ratio to the Layer Profile and Crystal Quality of SiGe/Si Multilayers

Radamson, H. H., Moeen, M., Abedin, A., Hojabri, A., Salemi, A., Kolahdouz, M.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.52 MB

english, 2016

19

Ru-Induced Deep Levels in Ru/4H-SiC Epilayer Schottky Diodes by Deep Level Transient Spectroscopy

Nguyen, Khai V., Mandal, Krishna C.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 440 KB

english, 2016

20

Analysis of Point Defect Distributions in AlGaN/GaN Heterostructures via Spectroscopic Photo Current-Voltage Measurements

Ozden, Burcu, Khanal, Min P., Youn, Suhyeon, Mirkhani, Vahid, Yapabandara, Kosala, Park, Minseo, Zhao, Ming, Liang, Hu, Kandaswamy, Prem Kumar, Saripalli, Y. N.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 422 KB

english, 2016

21

Low Frequency Radio Wave Detection of Electrically Active Defects in Dielectrics

Obeng, Yaw S., Okoro, Chukwudi A., Amoah, Papa K., Franklin, Rhonda R., Kabos, Pavel

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 752 KB

english, 2016

22

Photoluminescence Characterization of Interface Quality of Bonded Silicon Wafers

Yoo, Woo Sik, Ishigaki, Toshikazu, Kang, Kitaek

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.21 MB

english, 2016

23

Defect Formation of Nickel-Incorporated Large-Diameter Czochralski-Grown Silicon and Their Effect on Gate Oxide Reliability

Lee, Anselmo Jaehyeong, Im, Ji-Seong, Kang, Hee-Bog, Lee, Sung-Wook

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 756 KB

english, 2016

24

Deep Levels in W-Doped Czochralski Silicon

Simoen, E., Saga, K., Vrielinck, H., Lauwaert, J.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.34 MB

english, 2016

25

Preface to the Focus Issue on Defect Characterization in Semiconductor Materials and Devices

Simoen, Eddy, De Gendt, Stefan

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 62 KB

english, 2016

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски