Bandgap narrowing in strained SiGe on the basis of...

Bandgap narrowing in strained SiGe on the basis of electrical measurements on Si/SiGe/Si hetero bipolar transistors

J Eberhardt, E Kasper
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Volume:
89
Year:
2002
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(01)00808-x
File:
PDF, 227 KB
english, 2002
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