Super self-aligned technology of ultra-shallow junction in MOSFETs using selective Si1−xGex CVD
Tadayoshi Yamashiro, Toshifumi Kikuchi, Makoto Ishii, Fumitaka Honma, Masao Sakuraba, Takashi Matsuura, Junichi Murota, Toshiaki TsuchiyaVolume:
89
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(01)00814-5
File:
PDF, 285 KB
english, 2002