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Measurement of mounting-induced strain and defects in high-power laser diodes using Fourier-transform photo-current spectroscopy
A Gerhardt, J.W Tomm, R Müller, A Bärwolff, D Lorenzen, J DoneckerVolume:
91-92
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(01)01007-8
File:
PDF, 143 KB
english, 2002