Volume 91-92; Issue none

Materials Science and Engineering: B

Volume 91-92; Issue none
15

Measurement of the infrared absorbance of nitrogen in CZ silicon

Year:
2002
Language:
english
File:
PDF, 113 KB
english, 2002
42

Contactless surface charge semiconductor characterization

Year:
2002
Language:
english
File:
PDF, 933 KB
english, 2002
52

Studies of growth bands in Si:Ge crystals

Year:
2002
Language:
english
File:
PDF, 160 KB
english, 2002
53

Precipitation in low temperature grown GaAs

Year:
2002
Language:
english
File:
PDF, 195 KB
english, 2002
54

Analysis of localized vibration of nitrogen in silicon

Year:
2002
Language:
english
File:
PDF, 205 KB
english, 2002
55

Effect of defects on the degradation of ZnSe-based white LEDs

Year:
2002
Language:
english
File:
PDF, 186 KB
english, 2002
62

On the morphology and composition of InAs/GaAs quantum dots

Year:
2002
Language:
english
File:
PDF, 302 KB
english, 2002
74

Characterization of deep levels in rapid-thermal-annealed AlGaInP

Year:
2002
Language:
english
File:
PDF, 157 KB
english, 2002
84

Effects of thermal annealing on GaN epilayers deposited on (0001) sapphire

Year:
2002
Language:
english
File:
PDF, 95 KB
english, 2002
87

Photoenhanced wet chemical etching of n+-doped GaN

Year:
2002
Language:
english
File:
PDF, 344 KB
english, 2002
99

Study of carrier recombination at structural defects in InGaN films

Year:
2002
Language:
english
File:
PDF, 172 KB
english, 2002
102

Investigations of surface defects of GaAs grown by molecular beam epitaxy

Year:
2002
Language:
english
File:
PDF, 155 KB
english, 2002
107

Cathodoluminescence defectoscopy of ZnS and ZnSe crystals

Year:
2002
Language:
english
File:
PDF, 258 KB
english, 2002
113

Electrical properties of SiC: characterisation of bulk crystals and epilayers

Year:
2002
Language:
english
File:
PDF, 274 KB
english, 2002
117

Preface

Year:
2002
Language:
english
File:
PDF, 40 KB
english, 2002
118

Author index

Year:
2002
File:
PDF, 44 KB
2002
119

Subject index

Year:
2002
Language:
english
File:
PDF, 103 KB
english, 2002