![](/img/cover-not-exists.png)
Frequency-domain EBIC method for mapping of noise and instability regions in semiconductor devices
A. Šatka, D. Donoval, F. MikaVolume:
91-92
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(01)01019-4
File:
PDF, 147 KB
english, 2002