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HgCdTe extended defects electrical activity characterization by variable magnetic field hall measurements
N.N. Berchenko, K.R. Kurbanov, A.Yu. Nikiforov, A.V. KorovinVolume:
44
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(96)01814-4
File:
PDF, 483 KB
english, 1997