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In-situ reflectometry and RDS monitoring of atomic layer MBE of ZnSe and ZnTe on GaAs
Marcus J. Kastner, Rainer Duschl, Eva Soßna, Wolfgang GebhardtVolume:
43
Year:
1997
Language:
english
Pages:
5
DOI:
10.1016/s0921-5107(96)01828-4
File:
PDF, 440 KB
english, 1997