Growth of atomically smooth AlN films with a 5:4...

Materials Science and Engineering: B 1999 Vol. 59; Iss. 1-3

Growth of atomically smooth AlN films with a 5:4 coincidence interface on Si(111) by MBE

H.P.D. Schenk, U. Kaiser, G.D. Kipshidze, A. Fissel, J. Kräußlich, H. Hobert, J. Schulze, Wo. Richter
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
59
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(98)00328-6
File:
PDF, 836 KB
english, 1999
Conversion to is in progress
Conversion to is failed