![](/img/cover-not-exists.png)
The influence of MOCVD process scheme on the optical properties of GaN layers
M Ciorga, L Bryja, J Misiewicz, R Paszkiewicz, R Korbutowicz, M Panek, B Paszkiewicz, M TłaczałaVolume:
59
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(98)00405-x
File:
PDF, 97 KB
english, 1999