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High-precision determination of atomic positions in 4H– and 6H–SiC crystals
A. Bauer, J. Kräusslich, P. Kuschnerus, K. Goetz, P. Käckell, F. BechstedtVolume:
61-62
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(98)00505-4
File:
PDF, 162 KB
english, 1999