Comparative analysis of the 1.54 μm emission of Er-doped Si/SiO2 films and the size distribution of the nanostructure
Luis F. Fonseca, O. Resto, R.K. Soni, M. Buzaianu, S.Z. Weisz, M. Gomez, W. JiaVolume:
72
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0921-5107(99)00505-x
File:
PDF, 112 KB
english, 2000