Volume 72; Issue 2-3

Materials Science and Engineering: B

Volume 72; Issue 2-3
1

Editorial

Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 29 KB
english, 2000
2

Index

Journal:
Materials Science and Engineering: B
Year:
2000
File:
PDF, 34 KB
2000
3

Index

Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 52 KB
english, 2000
13

Oxygen transportation during Czochralski silicon crystal growth

Keigo Hoshikawa, Xinming Huang
Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 258 KB
english, 2000
14

Defect reaction and its application to silicon materials technology

Koji Sumino
Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 686 KB
english, 2000
27

Drift diffusion and hydrodynamic simulations of Si/SiGe p-MOSFETs

Y.P Zhao, J.R Watling, S Kaya, A Asenov, J.R Barker
Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 124 KB
english, 2000
28

Current trends in silicon defect technology

W.Murray Bullis
Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 82 KB
english, 2000
33

Diffusion, solubility and gettering of copper in silicon

A.A Istratov, C Flink, H Hieslmair, S.A McHugo, E.R Weber
Journal:
Materials Science and Engineering: B
Year:
2000
Language:
english
File:
PDF, 136 KB
english, 2000