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Fermi-Level Effects on Extended Defect Evolution in Si + and P + Implanted In 0.53 Ga 0.47 As
Lind, A. G., Aldridge, H. L., Bomberger, C. C., Hatem, C., Zide, J. M. O., Jones, K. S.Volume:
5
Year:
2016
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0141604jss
File:
PDF, 1.32 MB
english, 2016