Investigation of a Reliable Ohmic Contact to n-Type ZnO Thin Films Prepared by Sol–Gel Method
Eslami Jahromi, Khalil, Majles Ara, Mohammad Hossein, Mousavi, Seyedeh Soraya, Efafi, BabakVolume:
37
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2504624
Date:
January, 2016
File:
PDF, 846 KB
english, 2016