Characterization of BaTiO3 thin films on p-Si

Materials Science in Semiconductor Processing 2001 Vol. 4; Iss. 1-3

Characterization of BaTiO3 thin films on p-Si

E.K. Evangelou, N. Konofaos, X. Aslanoglou, S. Kennou, C.B. Thomas
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Volume:
4
Year:
2001
Language:
english
Pages:
3
DOI:
10.1016/s1369-8001(00)00109-8
File:
PDF, 130 KB
english, 2001
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