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Scanning capacitance microscopy investigations of SiC structures
O. Bowallius, S. Anand, N. Nordell, G. Landgren, S. KarlssonVolume:
4
Year:
2001
Language:
english
Pages:
3
DOI:
10.1016/s1369-8001(00)00132-3
File:
PDF, 107 KB
english, 2001