Defects and Dopants in Silicon Nanowires Produced by...

ECS Journal of Solid State Science and Technology 2016 Vol. 5; Iss. 4

Defects and Dopants in Silicon Nanowires Produced by Metal-Assisted Chemical Etching

Fanciulli, M., Belli, M., Paleari, S., Lamperti, A., Sironi, M., Pizio, A.
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Volume:
5
Year:
2016
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0171604jss
File:
PDF, 373 KB
english, 2016
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