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The Impact of Self-Heating on Charge Trapping in High- $k$ -Metal-Gate nFETs
Khan, Faraz, Cartier, Eduard, Kothandaraman, Chandrasekara, Scott, J. Campbell, Woo, Jason C. S., Iyer, Subramanian S.Volume:
37
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2504952
Date:
January, 2016
File:
PDF, 947 KB
english, 2016