Study on Ag-Plated Cu Lead Frame and Its Effect to LED Performance Under Thermal Aging
Zhang, Lei, Zhu, Yejun, Wang, Wei, Bi, Xianghong, Chen, Haibin, Leung, Karina, Wu, Yeqing, Wu, JingshenVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2014.2360081
Date:
December, 2014
File:
PDF, 1.98 MB
english, 2014