Review—Properties of Intrinsic Point Defects in Si and Ge...

ECS Journal of Solid State Science and Technology 2016 Vol. 5; Iss. 4

Review—Properties of Intrinsic Point Defects in Si and Ge Assessed by Density Functional Theory

Sueoka, Koji, Kamiyama, Eiji, Śpiewak, Piotr, Vanhellemont, Jan
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Volume:
5
Year:
2016
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0251604jss
File:
PDF, 3.54 MB
english, 2016
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