Contact Length Scaling in Staggered Organic Thin-Film...

IEEE Electron Device Letters 2015 / 6 Vol. 36; Iss. 6

Contact Length Scaling in Staggered Organic Thin-Film Transistors

Wang, Hong, Wang, Wei, Sun, Pengxiao, Ma, Xiaohua, Li, Ling, Liu, Ming, Hao, Yue
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2015.2423000
Date:
June, 2015
File:
PDF, 1.33 MB
english, 2015
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