Full-Chip Power Supply Noise Time-Domain Numerical Modeling...

IEEE Transactions on Electron Devices 2016 / 3 Vol. 63; Iss. 3

Full-Chip Power Supply Noise Time-Domain Numerical Modeling and Analysis for Single and Stacked ICs

Zheng, Li, Zhang, Yang, Bakir, Muhannad S.
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2521362
Date:
March, 2016
File:
PDF, 2.16 MB
english, 2016
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