Compact model for non-local avalanche effect in advanced...

Solid-State Electronics 2016 / 05 Vol. 119

Compact model for non-local avalanche effect in advanced bipolar transistors: An assessment of the relaxation length and its temperature dependence

Setekera, Robert, van der Toorn, Ramses
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
119
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.02.007
Date:
May, 2016
File:
PDF, 821 KB
english, 2016
Conversion to is in progress
Conversion to is failed