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Volume 119
Main
Solid-State Electronics
Volume 119
Solid-State Electronics
Volume 119
1
Mid-wave T2SLs InAs/GaSb single pixel PIN detector with GaAs immersion lens for HOT condition
Martyniuk, Piotr
,
Benyahia, Djalal
,
Kowalewski, Andrzej
,
Kubiszyn, Łukasz
,
Stępień, Dawid
,
Gawron, Waldemar
,
Rogalski, Antoni
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 1.58 MB
Your tags:
english, 2016
2
Small signal model parameters analysis of GaN and GaAs based HEMTs over temperature for microwave applications
Alim, Mohammad A.
,
Rezazadeh, Ali A.
,
Gaquiere, Christophe
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 2.47 MB
Your tags:
english, 2016
3
A study on geometry effect of transmission coil for micro size magnetic induction coil
Lee, Kyung Hwa
,
Jun, Byoung Ok
,
Kim, Seunguk
,
Lee, Gwang Jun
,
Ryu, Mingyu
,
Choi, Ji-Woong
,
Jang, Jae Eun
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 1.52 MB
Your tags:
english, 2016
4
A circuit model for defective bilayer graphene transistors
Umoh, Ime J.
,
Moktadir, Zakaria
,
Hang, Shuojin
,
Kazmierski, Tom J.
,
Mizuta, Hiroshi
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 843 KB
Your tags:
english, 2016
5
Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors
Kwon, Sung-Kyu
,
Kwon, Hyuk-Min
,
Choi, Woon-Il
,
Song, Hyeong-Sub
,
Lee, Hi-Deok
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 813 KB
Your tags:
english, 2016
6
Compact model for non-local avalanche effect in advanced bipolar transistors: An assessment of the relaxation length and its temperature dependence
Setekera, Robert
,
van der Toorn, Ramses
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 821 KB
Your tags:
english, 2016
7
Equivalent-circuit modeling of a MEMS phase detector for phase-locked loop applications
Han, Juzheng
,
Liao, Xiaoping
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 2.20 MB
Your tags:
english, 2016
8
Corrigendum to “High-ohmic resistors fabricated by PureB layer for silicon drift detectors applications” [Solid State Electron. 105 (2015) 6–11]
Golshani, Negin
,
Derakhshandeh, Jaber
,
Beenakker, C.I.M.
,
Ishihara, R.
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 194 KB
Your tags:
english, 2016
9
Evolution of the gate current in 32nm MOSFETs under irradiation
Palumbo, F.
,
Debray, M.
,
Vega, N.
,
Quinteros, C.
,
Kalstein, A.
,
Guarin, F.
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 622 KB
Your tags:
english, 2016
10
Editorial Board
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 55 KB
Your tags:
english, 2016
11
Trigger voltage walk-out phenomenon in SOI lateral insulated gate bipolar transistor under repetitive electrostatic discharge stresses
Zhang, Shifeng
,
Han, Yan
,
Ma, Fei
Journal:
Solid-State Electronics
Year:
2016
Language:
english
File:
PDF, 2.01 MB
Your tags:
english, 2016
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