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Poisson-Schroedinger-Continuity two-dimensional analysis of both short (ballistic) and long (drift-diffusion) III–V FETs
Gili, A., Sarras, S., Xanthakis, J.P.Volume:
159
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2016.04.023
Date:
June, 2016
File:
PDF, 903 KB
english, 2016