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Toward Ultrafast Electron Microscopy
King, Wayne E., Campbell, Geoffrey H., Frank, Alan, Reed, Bryan, Schmerge, John, Siwick, Bradley, Stuart, Brent, Weber, PeterVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555733
Date:
August, 2004
File:
PDF, 84 KB
english, 2004