Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens
Haider, Max, Müller, HeikoVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555551
Date:
August, 2004
File:
PDF, 415 KB
english, 2004