Design of an Electron Optical System for the Correction of...

Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens

Haider, Max, Müller, Heiko
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555551
Date:
August, 2004
File:
PDF, 415 KB
english, 2004
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