Prospects for Bright Field and Dark Field Electron...

Microscopy and Microanalysis 2004 / 8 Vol. 10; Iss. S03

Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid

Jinschek, J. R., Batenburg, K. J., Calderon, H. A., Van Dyck, D., Chen, F.-R., Radmilovic, V., Kisielowski, C.
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Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555629
Date:
August, 2004
File:
PDF, 1.16 MB
english, 2004
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