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In Situ PEEL Spectroscopic Determination and EFTEM Imaging of Multiple Materials Properties at the Nanoscale Using Universality and Scaling in Solid-State Property-Plasmon Energy Relationships: New Capabilities for Analytical Electron Microscopy
Oleshko, Vladimir P., Howe, James M.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555721
Date:
August, 2004
File:
PDF, 388 KB
english, 2004