The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector
Kenik, E. A., Anderson, I. M., Joy, D. C., Demers, H.Volume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604555757
Date:
August, 2004
File:
PDF, 331 KB
english, 2004