MPSoC application resilience by hardware-assisted communication virtualization
Rösch, S., Rauchfuss, H., Wallentowitz, S., Wild, T., Herkersdorf, A.Volume:
61
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.02.009
Date:
June, 2016
File:
PDF, 981 KB
english, 2016