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Volume 61
Main
Microelectronics Reliability
Volume 61
Microelectronics Reliability
Volume 61
1
MPSoC application resilience by hardware-assisted communication virtualization
Rösch, S.
,
Rauchfuss, H.
,
Wallentowitz, S.
,
Wild, T.
,
Herkersdorf, A.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 981 KB
Your tags:
english, 2016
2
Investigation on LDMOS-SCR with high holding current for high voltage ESD protection
Liang, Hailian
,
Bi, Xiuwen
,
Gu, Xiaofeng
,
Cao, Huafeng
,
Zhang, Yun
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.32 MB
Your tags:
english, 2016
3
The variation of the leakage current characteristics of W/Ta2O5/W MIM capacitors with the thickness of the bottom W electrode
Yu, D.Q.
,
Lau, W.S.
,
Wong, Hei
,
Feng, Xuan
,
Dong, Shurong
,
Pey, K.L.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 708 KB
Your tags:
english, 2016
4
Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28nm processing
Wang, Weihuai
,
Jin, Hao
,
Guo, Wei
,
Dong, Shurong
,
Liang, Wei
,
Liou, Juin J.
,
Han, Yan
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2016
5
Editorial Board
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 37 KB
Your tags:
english, 2016
6
Effects of thermal annealing on the charge localization characteristics of HfO2/Au/HfO2 stack
Feng, Xuan
,
Dong, Shurong
,
Wong, Hei
,
Yu, Danqun
,
Pey, K.L.
,
Shubhakar, K.
,
Lau, W.S.
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 622 KB
Your tags:
english, 2016
7
Editorial
Asenov, Asen
,
Schichtmann, Ulf
,
Tan, Cher Ming
,
Wong, Hei
,
Zhou, Xing
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 140 KB
Your tags:
english, 2016
8
A cross layer approach for efficient thermal management in 3D stacked SoCs
Jung, Matthias
,
Weis, Christian
,
Wehn, Norbert
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.27 MB
Your tags:
english, 2016
9
Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices
Mei, Sen
,
Bosman, Michel
,
Nagarajan, Raghavan
,
Wu, Xing
,
Pey, Kin Leong
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 1.39 MB
Your tags:
english, 2016
10
A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits
Habal, Husni
,
Graeb, Helmut
Journal:
Microelectronics Reliability
Year:
2016
Language:
english
File:
PDF, 687 KB
Your tags:
english, 2016
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