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20GHz on-chip measurement of ESD waveform for system level analysis
Caignet, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N.Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.12.021
Date:
November, 2015
File:
PDF, 2.13 MB
english, 2015