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Volume 55; Issue 11
Main
Microelectronics Reliability
Volume 55; Issue 11
Microelectronics Reliability
Volume 55; Issue 11
1
The effect of various concentrations of PVDF-HFP polymer gel electrolyte for dye-sensitized solar cell
Chou, Hsueh-Tao
,
Hsu, Ho-Chun
,
Lien, Chiu-Hui
,
Chen, Shi-Ting
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 544 KB
Your tags:
english, 2015
2
Design space exploration of non-uniform cache access for soft-error vulnerability mitigation
Maghsoudloo, Mohammad
,
Zarandi, Hamid R.
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 1.57 MB
Your tags:
english, 2015
3
Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2
Lee, Hao-Chieh
,
Chang-Liao, Kuei-Shu
,
Li, Yan-Lin
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 877 KB
Your tags:
english, 2015
4
Cu–Al intermetallic compound investigation using ex-situ post annealing and in-situ annealing
Tan, Y.Y.
,
Yang, Q.L.
,
Sim, K.S.
,
Sun, Li Tao
,
Wu, Xing
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 2.98 MB
Your tags:
english, 2015
5
Improving retention properties by thermal imidization for polyimide-based nonvolatile resistive random access memories
Hsiao, Yu-Ping
,
Yang, Wen-Luh
,
Lin, Li-Min
,
Chin, Fun-Tat
,
Lin, Yu-Hsien
,
Yang, Ke-Luen
,
Wu, Chi-Chang
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 2.12 MB
Your tags:
english, 2015
6
Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics
Lin, K.C.
,
Juan, P.C.
,
Liu, C.H.
,
Wang, M.C.
,
Chou, C.H.
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 842 KB
Your tags:
english, 2015
7
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment
Wang, Shea-Jue
,
Wang, Mu-Chun
,
Chen, Shuang-Yuan
,
Lan, Wen-How
,
Yang, Bor-Wen
,
Huang, L.S.
,
Liu, Chuan-Hsi
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 1.12 MB
Your tags:
english, 2015
8
Reliability investigations on LIFT-printed isotropic conductive adhesive joints for system-in-foil applications
Sridhar, Ashok
,
Perinchery, Sandeep M.
,
Smits, Edsger C.P.
,
Mandamparambil, Rajesh
,
van den Brand, Jeroen
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2015
9
20GHz on-chip measurement of ESD waveform for system level analysis
Caignet, F.
,
Nolhier, N.
,
Bafleur, M.
,
Wang, A.
,
Mauran, N.
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 2.13 MB
Your tags:
english, 2015
10
Zinc oxide-praseodymia semiconducting varistors having a powerful surge suppression capability
Nahm, Choon-W.
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 1.50 MB
Your tags:
english, 2015
11
Editorial Board
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 70 KB
Your tags:
english, 2015
12
Ultra sensitive measurement of dielectric current under pulsed stress conditions
Helfmeier, Clemens
,
Beyreuther, Anne
,
Fox, Alexander
,
Boit, Christian
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 645 KB
Your tags:
english, 2015
13
Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature
Chi, Wei-Fong
,
Chang-Liao, Kuei-Shu
,
Yi, Shih-Han
,
Li, Chen-Chien
,
Li, Yan-Lin
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 1.08 MB
Your tags:
english, 2015
14
Editorial
Liou, Juin J.
,
Lin, Chun-Chieh
,
Lin, Chu-Hsuan
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 121 KB
Your tags:
english, 2015
15
Impact of laminate cracks under solder pads on the fatigue lives of ball grid array solder joints
Tegehall, Per-Erik
,
Wetter, Göran
Journal:
Microelectronics Reliability
Year:
2015
Language:
english
File:
PDF, 4.80 MB
Your tags:
english, 2015
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