![](/img/cover-not-exists.png)
Novel shock wave excitation method for dynamic characterization of microstructures
She, Dongsheng, Yang, Yiliu, Wei, Zefei, Li, Kun, Yu, Zhen, Ding, FengVolume:
23
Language:
english
Journal:
Microsystem Technologies
DOI:
10.1007/s00542-015-2691-4
Date:
January, 2017
File:
PDF, 898 KB
english, 2017