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A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits
Habal, Husni, Graeb, HelmutVolume:
61
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.01.001
Date:
June, 2016
File:
PDF, 687 KB
english, 2016