Impact of gate dielectric thickness on the electrical...

Impact of gate dielectric thickness on the electrical properties of AlGaN/GaN MISHFETs on Si(111) substrate

Martin Eickelkamp, Dirk Fahle, Johannes Lindner, Michael Heuken, Christian Lautensack, Holger Kalisch, Rolf H. Jansen, Andrei Vescan
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Volume:
207
Year:
2010
Language:
english
Pages:
3
DOI:
10.1002/pssa.200983554
File:
PDF, 246 KB
english, 2010
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