Mapping misorientation and crystallographic tilt in GaN layers via polychromatic microdiffraction
R. I. Barabash, G. E. Ice, W. Liu, C. Roder, S. Figge, S. Einfeldt, D. Hommel, T. M. Katona, J. S. Speck, S. P. DenBaars, R. F. DavisVolume:
243
Year:
2006
Language:
english
Pages:
6
DOI:
10.1002/pssb.200565442
File:
PDF, 1.36 MB
english, 2006