Analysis of buffer-trapping effects on current collapse of...

Analysis of buffer-trapping effects on current collapse of GaN FETs

K. Horio, H. Takayanagi, H. Nakano
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Volume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565108
File:
PDF, 122 KB
english, 2006
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