Piezoelectric properties of thin AlN layers for MEMS...

Piezoelectric properties of thin AlN layers for MEMS application determined by piezoresponse force microscopy

K. Tonisch, V. Cimalla, Ch. Foerster, D. Dontsov, O. Ambacher
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Volume:
3
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/pssc.200565123
File:
PDF, 232 KB
english, 2006
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